Scanning Kelvin probe


In microscopy, a scanning Kelvin probe is a non-contact, non-destructive scanning probe microscopy technique used to measure the work function of the sample under study. By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features. It is predominantly used to measure corrosion and coatings. It is closely related to the Kelvin probe force microscope technique.

History

The SKP technique is based on parallel plate capacitor experiments performed by Lord Kelvin in 1898. In the 1930s William Zisman built upon Lord Kelvin's experiments to develop a technique to measure contact potential differences of dissimilar metals.

Principle of Operation

In SKP the probe and sample are held parallel to each other and electrically connected to form a parallel plate capacitor. The probe is selected to be of a different material to the sample, therefore each component initially has a distinct Fermi level. When electrical connection is made between the probe and the sample electron flow can occur between the probe and the sample in the direction of the lower to the higher Fermi level. This electron flow causes the equilibration of the probe and sample Fermi levels. Furthermore, a surface charge develops on the probe and the sample, with a related potential difference known as the contact potential. In SKP the probe is vibrated in the plane perpendicular to the plane of the sample. This vibration causes a change in probe to sample distance, which in turn results in the flow of current, taking the form of an ac sine wave. The resulting ac sine wave is demodulated to a dc signal through the use of a lock-in amplifier. Typically the user must select the correct reference phase value used by the lock-in amplifier. Once the dc potential has been determined, an external potential, known as the backing potential can be applied to null the charge between the probe and the sample. When the charge is nulled the Fermi level of the sample returns to its original position. This means that Vb is equal to -Vc, which is the work function difference between the SKP probe and the sample measured.

Factors affecting SKP measurements

The quality of an SKP measurement is affected by a number of factors. This includes the diameter of the SKP probe, the probe to sample distance, and the material of the SKP probe. The probe diameter is important in the SKP measurement because it affects the overall resolution of the measurement, with smaller probes leading to improved resolution. On the other hand, reducing the size of the probe causes an increase in fringing effects which reduces the sensitivity of the measurement by increasing the measurement of stray capacitances. The material used in the construction of the SKP probe is important to the quality of the SKP measurement. This occurs for a number of reasons. Different materials have different work function values which will affect the contact potential measured. Different materials have a different sensitivity to humidity changes. The material can also affect the resulting lateral resolution of the SKP measurement. In commercial probes tungsten is used, though probes of platinum, copper, gold, and NiCr have been used. The probe to sample distance affects the final SKP measurement, with smaller probe to sample distances improving the lateral resolution and the signal-to-noise ratio of the measurement. Furthermore, reducing the SKP probe to sample distance increases the intensity of the measurement, where the intensity of the measurement is proportional to 1/d2, where d is the probe to sample distance. The effects of changing probe to sample distance on the measurement can be counteracted by using SKP in constant distance mode.

Applications

The Volta potential measured by SKP is directly proportional to the corrosion potential of a material, as such SKP has found widespread use in the study of the fields of corrosion and coatings. In the field of coatings for example, a scratched region of a self-healing shape memory polymer coating containing a heat generating agent on aluminium alloys was measured by SKP. Initially after the scratch was made the Volta potential was noticeably higher and wider over the scratch than over the rest of the sample, implying this region is more likely to corrode. The Volta potential decreased over subsequent measurements, and eventually the peak over the scratch completely disappeared implying the coating has healed. Because SKP can be used to investigate coatings in a non-destructive way it has also been used to determine coating failure. In a study of polyurethane coatings, it was seen that the work function increases with increasing exposure to high temperature and humidity. This increase in work function is related to decomposition of the coating likely from hydrolysis of bonds within the coating.
Using SKP the corrosion of industrially important alloys has been measured. In particular with SKP it is possible to investigate the effects of environmental stimulus on corrosion. For example, the microbially induced corrosion of stainless steel and titanium has been examined. SKP is useful to study this sort of corrosion because it usually occurs locally, therefore global techniques are poorly suited. Surface potential changes related to increased localized corrosion were shown by SKP measurements. Furthermore, it was possible to compare the resulting corrosion from different microbial species. In another example SKP was used to investigate biomedical alloy materials, which can be corroded within the human body. In studies on Ti-15Mo under inflammatory conditions, SKP measurements showed a lower corrosion resistance at the bottom of a corrosion pit than at the oxide protected surface of the alloy. SKP has also been used to investigate the effects of atmospheric corrosion, for example to investigate copper alloys in marine environment. In this study Kelvin potentials became more positive, indicating a more positive corrosion potential, with increased exposure time, due to an increase in thickness of corrosion products. As a final example SKP was used to investigate stainless steel under simulated conditions of gas pipeline. These measurements showed an increase in difference in corrosion potential of cathodic and anodic regions with increased corrosion time, indicating a higher likelihood of corrosion. Furthermore, these SKP measurements provided information about local corrosion, not possible with other techniques. 
SKP has been used to investigate the surface potential of materials used in solar cells, with the advantage that it is a non-contact, and therefore a non-destructive technique. It can be used to determine the electron affinity of different materials in turn allowing the energy level overlap of conduction bands of differing materials to be determined. The energy level overlap of these bands is related to the surface photovoltage response of a system.
As a non-contact, non-destructive technique SKP has been used to investigate latent fingerprints on materials of interest for forensic studies. When fingerprints are left on a metallic surface they leave behind salts which can cause the localized corrosion of the material of interest. This leads to a change in Volta potential of the sample, which is detectable by SKP. SKP is particularly useful for these analyses because it can detect this change in Volta potential even after heating, or coating by, for example, oils.
SKP has been used to analyze the corrosion mechanisms of schreibersite-containing meteorites. The aim of these studies has been to investigate the role in such meteorites in releasing species utilized in prebiotic chemistry.
In the field of biology SKP has been used to investigate the electric fields associated with wounding, and acupuncture points.